SIDEST: A sample-free framework for crop field boundary delineation by integrating super-resolution image reconstruction and dual edge-corrected Segment Anything model
Release time:2025-12-29Hits:
Impact Factor:
9.3
Affiliation of Author(s):
农学院
Journal:
COMPUTERS AND ELECTRONICS IN AGRICULTURE
Co-author:
Sun Haoran, Wei Zhijian, Yu Weiguo, Yang Gaoxiang, She Junnan, Zheng Hengbiao, Jiang Chongya, Yao Xia, Zhu Yan, Cao Weixing, Cheng Tao, Ali Iftikhar
