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李玉花
Lecturer (Higher Education Institution)
School/Department: College of Artificial Intelligence
Education Level:With Certificate of Graduation for Doctorate Study
Degree:Doctoral Degree in Engineering
Professional Title:
Lecturer (Higher Education Institution)
Alma Mater:
西安交通大学
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一种基于结构化高光谱系统的水果缺陷检测方法
Release time:2024-01-09
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Disigner of the Invention:
孙晔,汪小旵,李玉花,孙国祥
Type of Patent:
Patent
Authorization number:
ZL202110523323.9
Authorization Date:
2023-10-27
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