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谷洋洋
School/Department: College of Agriculture
Education Level:With Certificate of Graduation for Doctorate Study
Degree:Doctoral degree
Alma Mater:
南京农业大学
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SPSI: A novel composite index for estimating panicle number in winter wheat before heading from UAV multispectral imagery
Release time:2024-11-10
Hits:
Journal:
Plant Phenomics
Co-author:
Wu, Y., Wang, W., Gu, Y., Zheng, H., Yao, X., Zhu, Y., Cao, W., Cheng, T.*
Volume:
5
Page Number:
0087
Translation or Not:
no
Date of Publication:
2023-01-01
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Assessment of the influence of UAV-borne LiDAR scan angle and flight altitude on the estimation of wheat structural metrics with different leaf angle distributions
Next One:
Comparison of two novel methods for counting wheat ears in the field with terrestrial LiDAR