A New Test Point Selection Method for Analog Continuous Parameter Fault
Release time:2024-01-02Hits:
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Impact Factor:
0.607
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Affiliation of Author(s):
工学院（含乡镇企业学院）
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Journal:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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Co-author:
罗慧,卢伟,王友仁,王玲
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Document Code:
3nqjtki103iau7dvzz9aehcd917sj2wd
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Volume:
33
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Issue:
3
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Page Number:
339-352
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Translation or Not:
no
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Date of Publication:
2017-01-01
